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Today's methods for BER (bit-error-rate) testing of high-speed serial links such as PCIe and SATA rely on predetermined patterns that don't represent real-world situations. These patterns use a defined amount of jitter sent through a precise channel from a DUT's transmitter to its receiver; the DUT runs in a loopback state. Obtaining a valid BER measurement requires at least a trillion bits. The BER measurement is difficult to perform because of the test equipment needed and the setup to properly run the test.
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