NVMe Analyzers and Exercisers

OCP Datacenter NVMe SSD Compliance Suite

Open Compute Project (OCP) v1.0a and v2.0 Cloud SSD NVme Compliance Test Suite supports Hyperscale Data Centers compliance testing and provides unprecedented functionality, performance, and ease of use for testing enterprise storage devices.

The Summit Protocol Analyzer product line captures, decodes and displays PCIe 3.0 protocol traffic at data rates for x1, x2, x4, x8, x16 lane widths. Teledyne LeCroy’s PETracer™ Software Suite supports an extensive library of protocol decodes for virtually all PCIe applications. These decodes enable all Teledyne LeCroy analyzers to display data traffic with meaningful and easy-to-understand displays at multiple levels in the protocol stack, and all protocol decode libraries are included as standard features of every Teledyne LeCroy PCIe Express protocol analyzer. Key features for PCIe Solid-state Device (SSD) developers include libraries of decodes specifically designed for SSD protocols, such as NVM Express, SCSI Express and SATA Express.

The Summit Z3-16 is a critical test and verification tool intended to assist engineers in developing and improving the reliability of their systems. The Summit Z3-16 can emulate PCI Express root complexes or device endpoints, allowing new designs to be tested against corner case issues. The Summit Z3-16 can be programmed to run a variety of storage test scripts including the IOL INTERACT™ Teledyne-LeCroy EDITION Software from the UNH-IOL.

The Quarch Hot-Swap Solution enables automation of PCI Express and NVMe hot plug and fault injection testing for U.2/SFF-8639 form factor drives. Additional modules in the solution allow similar testing for x8 and x16 PCIe Slot based devices.

Quarch's Power Modules allow full range voltage margining, interruption and power consumption testing for all NVMe storage devices.

The SANBlaze SBExpress-RM4 test system is a PCIe® Gen4 hardware/software combination that is critical for testing U.2/U.3/M.2/EDSFF NVMe target devices. The hardware capabilities include hot plug, dual port, MI, Quarch integration, SRIS/SRNS clocking, thermal testing, voltage margining, power measurement and VDM. The VLUN software component includes a unique automated test suite called SBCert which includes over 450 built-in test scripts for testing conformance, compliance, namespace management, MI, device endurance, dual port, power & other negative test cases. The REST API allows you to define pass/fail criteria for any test. For integrators, the software also tests fabric attached devices over FC, RoCE & TCP. The ability to drive NVMe targets with a wide range of configurable attributes provides engineers with a flexible, scalable tool to simulate real disk and memory access environments and issues. Development, qualification and certification test cycles can be highly automated reducing time and surfacing issues and errors.

SANBlaze VirtuaLUN NVMe Initiator is a key piece of test equipment for anyone needing to test NVMe target devices. The VirtuaLUN feature set provides a unique set of functions applicable in all aspects of a product lifecycle; from development to design validation to test and QA. The ability to drive NVMe targets with a wide range of configurable attributes provides engineers with a flexible, scalable tool to simulate real disk and memory access environments and issues. Development, qualification and certification test cycles can be highly automated, reducing time and surfacing issues and errors.

 

 

The MLTT Software Suite is an application-based data- and signal-integrity testing solution for companies developing servers, switches, host bus adapters (HBAs), Ethernet network interface cards (NICs), converged network adapters (CNAs), and other storage equipment for next-generation converged storage networks. Facilitate design validation, accelerate system bring-up, and simplify quality assurance testing with the MLTT suite for the most comprehensive set of data integrity, benchmarking, and stress-test tools. The MLTT test tools can help uncover and identify data-corruption errors, undesirable device and system data-pattern sensitivities, input/output (I/O) timeouts, I/O losses, and system lockup scenarios.